Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing - Mohammad Tehranipoor - Books - Springer-Verlag New York Inc. - 9781441945136 - November 23, 2010
In case cover and title do not match, the title is correct

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2008 edition

Mohammad Tehranipoor

Price
HK$ 1,446
excl. VAT

Ordered from remote warehouse

Expected delivery Jun 18 - Jul 1

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2008 edition

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.

422 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 23, 2010
ISBN13 9781441945136
Publishers Springer-Verlag New York Inc.
Pages 408
Dimensions 155 × 235 × 21 mm   ·   589 g
Editor Tehranipoor, Mohammad
Show all

More by Mohammad Tehranipoor

See all of Mohammad Tehranipoor ( e.g. Hardcover Book and Paperback Book )