Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing - Mohammad Tehranipoor - Books - Springer-Verlag New York Inc. - 9780387747460 - December 10, 2007
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 2008 edition

Mohammad Tehranipoor

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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability - Frontiers in Electronic Testing 2008 edition

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes.

424 pages, 1, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 10, 2007
ISBN13 9780387747460
Publishers Springer-Verlag New York Inc.
Pages 408
Dimensions 155 × 235 × 23 mm   ·   811 g
Language English  
Editor Tehranipoor, Mohammad
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