Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing - Leendert M. Huisman - Books - Springer-Verlag New York Inc. - 9781441937674 - December 8, 2010
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Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2005 edition

Leendert M. Huisman

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Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing Softcover reprint of hardcover 1st ed. 2005 edition

The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.

250 pages, 46 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 8, 2010
ISBN13 9781441937674
Publishers Springer-Verlag New York Inc.
Pages 250
Dimensions 155 × 235 × 14 mm   ·   385 g

See all of Leendert M. Huisman ( e.g. Hardcover Book and Paperback Book )