Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing - Leendert M. Huisman - Books - Springer-Verlag New York Inc. - 9780387249933 - June 21, 2005
In case cover and title do not match, the title is correct

Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing 2005 edition

Leendert M. Huisman

Price
$ 122.99
excl. VAT

Ordered from remote warehouse

Expected delivery May 30 - Jun 12

Our customers say:

14-day return policy in accordance with European consumer protection law
Top ranking on Trustpilot
Add to your iMusic wish list

Also available as:

Data Mining and Diagnosing IC Fails - Frontiers in Electronic Testing 2005 edition

The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part.

250 pages, 46 black & white illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 21, 2005
ISBN13 9780387249933
Publishers Springer-Verlag New York Inc.
Pages 250
Dimensions 155 × 235 × 15 mm   ·   576 g
Language English  

See all of Leendert M. Huisman ( e.g. Hardcover Book and Paperback Book )