Field-Ion Microscopy - Crystals - R. Wagner - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642686894 - December 7, 2011
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Field-Ion Microscopy - Crystals Softcover reprint of the original 1st ed. 1982 edition

R. Wagner

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Field-Ion Microscopy - Crystals Softcover reprint of the original 1st ed. 1982 edition

Despite the recent progress in developing various microanalytical tools of better spatial resolution and more sensitivity to chemical analyses for the study of various defects in metallic solids the Field-Ion Microscope (FIM) still remains the only instrument up to now to resolve single atoms in the surface of a metal.

134 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 7, 2011
ISBN13 9783642686894
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 118
Dimensions 170 × 244 × 7 mm   ·   226 g
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