Defect and Impurity Engineered Semiconductors and Devices: Volume 378 - MRS Proceedings - - Books - Materials Research Society - 9781558992818 - October 16, 1995
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Defect and Impurity Engineered Semiconductors and Devices: Volume 378 - MRS Proceedings

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Defect and Impurity Engineered Semiconductors and Devices: Volume 378 - MRS Proceedings

Defect engineering has come of age. That theme is well documented by both the academic and industrial research communities in this book from MRS. Going beyond defect control, the book explores the engineering of desired properties in semiconductor materials and devices through the deliberate introduction and manipulation of defects and impurities.

1054 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 16, 1995
ISBN13 9781558992818
Publishers Materials Research Society
Pages 1082
Dimensions 160 × 237 × 62 mm   ·   1.70 kg
Editor Akasaki, I. (Meijo University, Japan)
Editor Ashok, S. (Pennsylvania State University)
Editor Chevallier, J.
Editor Johnson, N. M. (Xerox Palo Alto Research Center, Stanford University, California)
Editor Sopori, B. L. (National Renewable Energy Laboratory, Golden, Colorado)