Microelectronic Test Structures for Cmos Technology - Manjul Bhushan - Books - Springer-Verlag New York Inc. - 9781489990556 - October 1, 2014
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Microelectronic Test Structures for Cmos Technology

Manjul Bhushan

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Microelectronic Test Structures for Cmos Technology

Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.

373 pages, 37 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 1, 2014
ISBN13 9781489990556
Publishers Springer-Verlag New York Inc.
Pages 373
Dimensions 155 × 235 × 21 mm   ·   566 g
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