Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK - Institute of Physics Conference Series - A G Cullis - Books - Taylor & Francis Ltd - 9780750306508 - 2000
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Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK - Institute of Physics Conference Series 1st edition

A G Cullis

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Microscopy of Semiconducting Materials: 1999 Proceedings of the Institute of Physics Conference held 22-25 March 1999, University of Oxford, UK - Institute of Physics Conference Series 1st edition

Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

774 pages, 1, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released 2000
ISBN13 9780750306508
Publishers Taylor & Francis Ltd
Pages 772
Dimensions 156 × 234 × 41 mm   ·   1.43 kg
Language English  
Editor Beanland, R (GEC-Marconi, Towcester, UK)
Editor Cullis, A.G (University of Sheffield, UK)
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