Nanometer Technology Designs: High-Quality Delay Tests - Nisar Ahmed - Books - Springer-Verlag New York Inc. - 9780387764863 - December 20, 2007
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Nanometer Technology Designs: High-Quality Delay Tests 2008 edition

Nisar Ahmed

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Nanometer Technology Designs: High-Quality Delay Tests 2008 edition

Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges.

304 pages, 1, black & white illustrations

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 20, 2007
ISBN13 9780387764863
Publishers Springer-Verlag New York Inc.
Pages 281
Dimensions 164 × 242 × 22 mm   ·   621 g
Language English  

See all of Nisar Ahmed ( e.g. Hardcover Book and Paperback Book )